Scanning microscopy for nanotechnology techniques and applications /
Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnol...
| Other Authors: | Zhou, Weilie., Wang, Zhong Lin., SpringerLink (Online service) |
|---|---|
| Format: | eBook |
| Language: | English |
| Published: |
New York ; London :
Springer,
2007.
New York ; London : 2007. |
| Physical Description: |
1 online resource (xiv, 522 pages, 12 unnumbered pages of plates) : illustrations (some color) |
| Subjects: |
CMU Electronic Access
Electronic Resource Click Here| Location | Call Number: | Status |
|---|---|---|
| CMU Electronic Access | Available |