AFM-based microelectrical characterization of grain boundaries in Cu(In,Ga)Se₂ thin films

Other Authors: Jiang, C.-S., National Renewable Energy Laboratory (U.S.)
Format: Electronic
Language: English
Published: Golden, Colo. : National Renewable Energy Laboratory, [2005]
Physical Description: 1 volume : digital, PDF file.
Series: Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-520-37338.
Subjects:
Online Access: https://purl.fdlp.gov/GPO/LPS68173
https://purl.fdlp.gov/GPO/LPS68173

CMU Gov Pub Electronic

Electronic Resource Click Here
LocationCall Number: Status
CMU Gov Pub Electronic E 9.17:NREL/CP-520-37338 Available