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AFM-based microelectrical characterization of grain boundaries in Cu(In,Ga)Se₂ thin films

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Bibliographic Details
Corporate Author:	National Renewable Energy Laboratory (U.S.)
Other Authors:	Jiang, C.-S. (Chun-Sheng)
Format:	Government Document Electronic eBook
Language:	English
Published:	Golden, Colo. : National Renewable Energy Laboratory, [2005]
Series:	Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-520-37338.
Physical Description:	1 volume : digital, PDF file.
Subjects:	Thin films -- Electric properties.
Online Access:	https://purl.fdlp.gov/GPO/LPS68173 Full text

Holdings details from CMU Gov Pub Electronic C502
Copy 1	CMU Gov Pub Electronic	E 9.17:NREL/CP-520-37338	Online

Internet

https://purl.fdlp.gov/GPO/LPS68173
Full text