Optical pattern recognition with microlasers

Main Author: Paek, Eung Gi.
Other Authors: National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1998]
Physical Description: 23 pages, 17 unnumbered pages : illustrations.
Series: NISTIR ; 6017.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.58:6017 Available