EMI/EMC metrology challenges for industry a workshop on measurements, standards, calibrations, and accreditation /
| Other Authors: | Butler, Chalmers M., National Institute of Standards and Technology (U.S.) |
|---|---|
| Format: | Microfilm |
| Language: | English |
| Published: |
Boulder, Colo. :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,
[1997]
|
| Physical Description: |
iii, 55 pages : illustrations. |
| Series: |
NISTIR ;
5068. |
| Subjects: |
CMU Storage Gov Pub Microfiche
| Location | Call Number: | Status |
|---|---|---|
| CMU Storage Gov Pub Microfiche | C 13.58:5068 | Available |