Joint DoD/NIST Workshop on International Manufacturing Systems Research and Development

Corporate Authors: Joint DoD/NIST Workshop on International Manufacturing Systems Research and Development Rockville, Md.)
Other Authors: Joint DoD/NIST Workshop on International Manufacturing Systems Research and Development, Meyer, John D., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: [Gaithersburg, Md.?] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1995]
Physical Description: vii, 233 pages : illustrations ; 28 cm.
Series: NIST special publication ; 873.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.10:873 Available