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Format: Microfilm
Institution
Collection
Format
Subject
2
Silica
1
Breast implants Health aspects
1
Ceramic materials
1
Electrochemical analysis
1
Ellipsometry
1
Fractography
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1
Infrared detectors Materials
1
Infrared spectroscopy
1
Infrared spectroscopy Statistical methods
1
Integrated circuits Wafer-scale integration
1
Laser pulses, Ultrashort
1
Lubrication and lubricants
1
Medical instruments and apparatus Safety measures
1
Oxygen Measurement
1
Oxygen Measurement Statistical methods
1
Semiconductor industry Government policy
1
Semiconductor wafers
1
Semiconductors
1
Semiconductors Measurement
1
Semiconductors Research
1
Semiconductors Standards
1
Silicon
1
Silicon Electric properties
1
Silicon Measurement
1
Silicon Measurement Statistical methods
1
Silicon Oxygen content Measurement
1
Silicon nitride Cracking
1
Silicon nitride Surfaces
1
Silicones Effect of temperature on
1
Silicones Heating
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Author
9
National Institute of Standards and Technology (U.S.)
1
Austin, Philip J.
1
Baghdadi, A.
1
Belzer, Barbara J.
1
Blackburn, David L.
1
Buch, Robert R.
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1
Bullis, W. Murray, 1930-
1
Center for Devices and Radiological Health (U.S.)
1
Croarkin, M. C. 1934-
1
Ehrstein, James R.
1
Gates, Richard Stephen, 1956-
1
Geological Survey (U.S.)
1
Haas, John L., Jr., 1932-2012
1
Hemingway, Bruce S.
1
Hsu, S. M.
1
Ives, L. K. 1937-
1
Jahanmir, Said
1
Kashiwagi, Takashi
1
National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs
1
National Institute of Standards and Technology (U.S.). Semiconductor Electronics Division
1
Neuharth, Clark R.
1
Quinn, G. D.
1
Rasmussen, A. L.
1
Rennex, Brian
1
Sanders, A. A.
1
Scace, Robert I.
1
Simpson, Philip A.
1
Stratmeyer, Melvin E.
1
Walters, E. Jane
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