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Call Number: C - Historical Sciences
Institution
Collection
Format
Subject
1
Ellipsometry
1
Infrared spectroscopy
1
Infrared spectroscopy Statistical methods
1
Integrated circuits Wafer-scale integration
1
Laser pulses, Ultrashort
1
Lubrication and lubricants
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1
Oxygen Measurement
1
Oxygen Measurement Statistical methods
1
Semiconductor wafers
1
Semiconductors
1
Silica
1
Silicon
1
Silicon Measurement
1
Silicon Measurement Statistical methods
1
Silicon nitride Surfaces
1
Silicones Effect of temperature on
1
Silicones Heating
1
Vaporization, Heats of
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Author
5
National Institute of Standards and Technology (U.S.)
1
Austin, Philip J.
1
Baghdadi, A.
1
Belzer, Barbara J.
1
Blackburn, David L.
1
Buch, Robert R.
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1
Bullis, W. Murray, 1930-
1
Gates, Richard Stephen, 1956-
1
Geological Survey (U.S.)
1
Hsu, S. M.
1
Kashiwagi, Takashi
1
National Institute of Standards and Technology (U.S.). Semiconductor Electronics Division
1
Rasmussen, A. L.
1
Sanders, A. A.
1
Scace, Robert I.
1
Simpson, Philip A.
1
United States. Bureau of Mines
1
United States. Bureau of Mines. Branch of Data Collection and Coordination
1
United States. Bureau of Mines. Branch of Ferrous Metals
1
United States. Bureau of Mines. Branch of Metals
1
United States. Bureau of Mines. Division of Ferrous Metals
1
United States. Bureau of Mines. Section of Ferrous Metals
1
Walters, E. Jane
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