Advances in imaging and electron physics Volume 118 /

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...

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Other Authors: Hawkes, P. W., ScienceDirect (Online service)
Format: eBook
Language: English
Published: San Diego, Calif. : Academic Press, [2001]
Physical Description: 1 online resource.
Series: Advances in imaging and electron physics ; v. 118.
Subjects:
Summary: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Item Description: Title from PDF title page (viewed Oct. 26, 2007).
Title from PDF title page (viewed Sep. 27, 2007).
Includes bibliographical references and index.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Front Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Contributors; Preface; Future Contributions; Chapter 1. Magnetic Resonance Imaging and Magnetization Transfer; Chapter 2. Noninterferometric Phase Determination; Chapter 3. Recent Developments of Probes for Scanning Probe Microscopy; Chapter 4. Morphological Image Enhancement and Segmentation; Index.
Physical Description: 1 online resource.
Bibliography: Includes bibliographical references and index.
ISBN: 9780080525464
0080525466
0120147602
9780120147601