Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS /

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for t...

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Main Author: Posser, Gracieli,
Other Authors: Sapatnekar, Sachin S., 1967-, Reis, Ricardo,, SpringerLink (Online service)
Format: eBook
Language: English
Published: Cham, Switzerland : Springer, 2017.
Physical Description: 1 online resource.
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