Reliability prediction from burn-in data fit to reliability models
This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability pu...
| Main Author: | Bernstein, Joseph B., |
|---|---|
| Other Authors: | ScienceDirect (Online service) |
| Format: | eBook |
| Language: | English |
| Published: |
London [England] :
Elsevier,
2014.
|
| Physical Description: |
1 online resource (108 pages) : illustrations. |
| Subjects: |
CMU Electronic Access
Electronic Resource Click Here| Location | Call Number: | Status |
|---|---|---|
| CMU Electronic Access | Available |