Reliability prediction from burn-in data fit to reliability models
This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability pu...
Main Author: | Bernstein, Joseph B., |
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Other Authors: | ScienceDirect (Online service) |
Format: | eBook |
Language: | English |
Published: |
London [England] :
Elsevier,
2014.
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Physical Description: |
1 online resource (108 pages) : illustrations. |
Subjects: |
CMU Electronic Access
Electronic Resource Click HereLocation | Call Number: | Status |
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CMU Electronic Access | Available |