CMOS test and evaluation a physical perspective /
This book extends test structure applications described in Microelectronic Test StrucU?tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and pro...
Main Author: | Bhushan, Manjul. |
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Other Authors: | Ketchen, Mark B., SpringerLink (Online service) |
Format: | eBook |
Language: | English |
Published: |
New York :
Springer,
[2015]
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Physical Description: |
1 online resource. |
Subjects: |
CMU Electronic Access
Electronic Resource Click HereLocation | Call Number: | Status |
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CMU Electronic Access | Available |