CMOS test and evaluation a physical perspective /

This book extends test structure applications described in Microelectronic Test StrucU?tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and pro...

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Main Author: Bhushan, Manjul.
Other Authors: Ketchen, Mark B., SpringerLink (Online service)
Format: eBook
Language: English
Published: New York : Springer, [2015]
Physical Description: 1 online resource.
Subjects:

CMU Electronic Access

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