Reliability physics and engineering time-to-failure modeling /
Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products. Key features include: · Materials/Device Degradation · Degradation Kinetics · Time-To-Failure Modeling · Statistical Tools · Failure-Rate Modeling...
| Main Author: | McPherson, J. W. |
|---|---|
| Other Authors: | SpringerLink (Online service) |
| Format: | eBook |
| Language: | English |
| Published: |
Cham ; New York :
Springer,
©2013.
Cham ; New York : [2013] |
| Physical Description: |
1 online resource. |
| Edition: | 2nd ed. |
| Subjects: |
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| 100 | 1 | |a McPherson, J. W. |q (Joe W.) |1 https://id.oclc.org/worldcat/entity/E39PCjKTmkHT8vfTdm3t89YwqP. | |
| 245 | 1 | 0 | |a Reliability physics and engineering : |b time-to-failure modeling / |c J.W. McPherson. |
| 250 | |a 2nd ed. | ||
| 260 | |a Cham ; |a New York : |b Springer, |c ©2013. | ||
| 264 | 1 | |a Cham ; |a New York : |b Springer, |c [2013] | |
| 264 | 4 | |c ©2013. | |
| 300 | |a 1 online resource. | ||
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| 505 | 0 | 0 | |t Introduction -- |t Materials and Device Degradation -- |t From Material/Device Degradation to Time-to-Failure -- |t Time-to-Failure Modeling -- |t Gaussian Statistics: An Overview -- |t Time-to-Failure Statistics -- |t Failure Rate Modeling -- |t Accelerated Degradation -- |t Acceleration Factor Modeling -- |t Ramp-to-Failure Testing -- |t Time-to-Failure Models for Selected Failure Mechanisms in Integrated Circuits -- |t Time-to-Failure Models for Selected Failure Mechanisms in Mechanical Engineering -- |t Conversion of Dynamical Stresses into Effective Static Values -- |t Increasing the Reliability of Device/Product Designs -- |t Screening -- |t Heat Generation and Dissipation -- |t Sampling Plans and Confidence Intervals. |
| 504 | |a Includes bibliographical references and index. | ||
| 520 | |a Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products. Key features include: · Materials/Device Degradation · Degradation Kinetics · Time-To-Failure Modeling · Statistical Tools · Failure-Rate Modeling · Accelerated Testing · Ramp-To-Failure Testing · Important Failure Mechanisms for Integrated Circuits · Important Failure Mechanisms for Mechanical Components · Conversion of Dynamic Stresses into Static Equivalents · Small Design Changes Producing Major Reliability Improvements · Screening Methods · Heat Generation and Dissipation · Sampling Plans and Confidence Intervals This textbook includes numerous example problems with solutions. Also, exercise problems along with the answers are included at the end of each chapter. Reliability Physics and Engineeringcan bea very useful resource for students, engineers, and materials scientists. | ||
| 650 | 0 | |a Reliability (Engineering) | |
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| 653 | 4 | |a Mathematical statistics. | |
| 653 | 4 | |a System safety. | |
| 653 | 4 | |a Electronics and Microelectronics, Instrumentation. | |
| 653 | 4 | |a Quality Control, Reliability, Safety and Risk. | |
| 653 | 4 | |a Statistical Theory and Methods. | |
| 653 | 4 | |a Energy, general. | |
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