An interpretation of the Guide to the expression of uncertainty in measurement

Main Author: Kacker, Raghu.
Other Authors: National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Gaithersburg, MD : Washington, DC : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For Sale by the Supt. of Docs., U.S. G.P.O., [2000]
Physical Description: 16 pages ; 28 cm.
Series: NIST special publication. Information technology.
NIST special publication ; 500-244.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.10:500-244 Available