An interpretation of the Guide to the expression of uncertainty in measurement
Main Author: | Kacker, Raghu. |
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Other Authors: | National Institute of Standards and Technology (U.S.) |
Format: | Microfilm |
Language: | English |
Published: |
Gaithersburg, MD : Washington, DC :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For Sale by the Supt. of Docs., U.S. G.P.O.,
[2000]
|
Physical Description: |
16 pages ; 28 cm. |
Series: |
NIST special publication. Information technology.
NIST special publication ; 500-244. |
Subjects: |
CMU Storage Gov Pub Microfiche
Location | Call Number: | Status |
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CMU Storage Gov Pub Microfiche | C 13.10:500-244 | Available |