Rockwell hardness measurement of metallic materials

Main Author: Low, Samuel R.
Other Authors: National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: [Gaithersburg, Md.] : [Washington, D.C. :] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [For sale by the Supt. of Docs., U.S. G.P.O.], [2001]
Physical Description: xii, 107 pages : illustrations ; 23 cm.
Also available via Internet from the NIST Web site (PDF file). Address as of 10-18-01: http://www.msel.nist.gov/practiceguidesSP960%5F5.pdf; current access is available via PURL.
Series: NIST recommended practice guide.
NIST special publication ; no. 960-5.
Subjects:

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