Rockwell hardness measurement of metallic materials
Main Author: | Low, Samuel R. |
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Other Authors: | National Institute of Standards and Technology (U.S.) |
Format: | Microfilm |
Language: | English |
Published: |
[Gaithersburg, Md.] : [Washington, D.C. :] :
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [For sale by the Supt. of Docs., U.S. G.P.O.],
[2001]
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Physical Description: |
xii, 107 pages : illustrations ; 23 cm. Also available via Internet from the NIST Web site (PDF file). Address as of 10-18-01: http://www.msel.nist.gov/practiceguidesSP960%5F5.pdf; current access is available via PURL. |
Series: |
NIST recommended practice guide.
NIST special publication ; no. 960-5. |
Subjects: |
CMU Storage Gov Pub Microfiche
Electronic Resource Click HereLocation | Call Number: | Status |
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CMU Storage Gov Pub Microfiche | C 13.10:960-5 | Available Place a Hold |