Report on NIST-NACLA MOU Workshop on June 20, 2000

Main Author: Leight, Walter G.
Other Authors: National Institute of Standards and Technology (U.S.), NIST-NACLA MOU Workshop
Format: Microfilm
Language: English
Published: [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
Physical Description: 1 volume (various pagings) ; 28 cm.
Series: NISTIR ; 6540.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.58:6540 Available