Uncertainty analysis procedures for dynamic radar cross section measurements at the Atlantic Test Range

Other Authors: Sorgnit, J., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1998]
Physical Description: 28 pages : illustrations.
Series: NISTIR ; 5073.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.58:5073 Available