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by Joy, David C., 1943-
Published: Springer, 2013
Description: 1 online resource (viii, 64 pages) : illustrations.
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Published: Academic, 1989
Description: 1 online resource (xiii, 452 pages) : illustrations.
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Fourth edition.
Published: Springer, 2018
Description: 1 online resource (xxiii, 550 pages) : illustrations (some color)
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Field ion microscopy Helium ions Ion bombardment Scanning electron microscopes Scanning electron microscopy Semiconductors