Critical advances in reminiscence work from theory to application /

Other Authors: Haight, Barbara K., Webster, Jeffrey D.
Format: Book
Language: English
Published: New York : Springer, [2002]
Physical Description: xix, 370 pages : illustrations ; 24 cm.
Subjects:

CMU Storage Books

LocationCall Number: Status
CMU Storage Books BF724.85.R45 C75 2002 Available
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