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02244cas a2200529 a 4500 |
001 |
45055885 |
003 |
OCoLC |
005 |
20031020093224.1 |
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he bmb024bbca |
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000921c19uu9999mduar b f0 0eng d |
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|a 2001238078
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040 |
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|a GAO
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|c GAO
|d IUL
|d GPO
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042 |
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|a lcd
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043 |
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|a n-us---
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049 |
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|a COMN
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074 |
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|a 0247-D (MF)
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090 |
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|a QC610.9
|b .S54
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245 |
0 |
0 |
|a Silicon microelectronics programs at the National Institute of Standards and Technology
|h [microform] /
|c Office of Microelectronics Programs.
|
260 |
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|a [Gaithersburg, MD] :
|b U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology.
|
300 |
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|a volumes :
|b illustrations.
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310 |
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|a Annual.
|
336 |
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|a text
|b txt
|2 rdacontent.
|
337 |
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|a microform
|b h
|2 rdamedia.
|
338 |
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|a microfiche
|b he
|2 rdacarrier.
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490 |
1 |
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|a NISTIR.
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500 |
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|a Description based on: June 2000.
|
533 |
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|a Microfiche.
|b [Washington, D.C.] :
|c Supt. of Docs., U.S. G.P.O.,
|e microfiches : negative..
|7 c19uu9999dcuarb.
|
610 |
2 |
0 |
|a National Institute of Standards and Technology (U.S.).
|b Office of Microelectronics Programs
|v Periodicals.
|
650 |
|
0 |
|a Semiconductors
|x Measurement
|v Periodicals.
|
650 |
|
0 |
|a Semiconductors
|x Standards
|z United States
|v Periodicals.
|
650 |
|
0 |
|a Semiconductors
|x Research
|z United States
|v Periodicals.
|
650 |
|
0 |
|a Semiconductor industry
|x Government policy
|z United States
|v Periodicals.
|
655 |
|
7 |
|a Periodicals.
|2 lcgft.
|
710 |
2 |
|
|a National Institute of Standards and Technology (U.S.).
|b Office of Microelectronics Programs.
|
710 |
2 |
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|a National Institute of Standards and Technology (U.S.)
|
830 |
|
0 |
|a NISTIR.
|
907 |
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|a .b23206810
|b cug
|c -
|d 031020
|e 230523
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998 |
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|a cug
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|a 060630
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948 |
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|a MARCIVE Comp, in 2022.12
|
948 |
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|a MARCIVE August, 2017
|
948 |
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|a MARCIVE extract Aug 5, 2017
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994 |
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|a 92
|b COM
|
995 |
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|a Loaded with m2btab.ltiac in 2022.12
|
995 |
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|a Loaded with m2btab.ltiac in 2017.08
|
995 |
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|a OCLC offline update by CMU
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989 |
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|a C 13.58/2:
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|e - -
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