Comparison of ISO/IEC 17025 with the NUPIC audit checklist

Main Author: Faison, C. Douglas.
Other Authors: National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: [Gaithersburg, MD] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2003]
Physical Description: iv, 31 pages ; 28 cm.
Series: NISTIR ; 6989.
Subjects:

CMU Storage Gov Pub Microfiche

LocationCall Number: Status
CMU Storage Gov Pub Microfiche C 13.58:6989 Available