Statistical analysis with ArcView GIS
Main Author: | Lee, Jay. |
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Other Authors: | Wong, David W. S. |
Format: | Book |
Language: | English |
Published: |
New York :
John Wiley,
[2001]
|
Physical Description: |
xi, 192 pages : illustrations, maps ; 25 cm. |
Subjects: |
CMU Main Books 3rd Floor
Electronic Resource Click HereLocation | Call Number: | Status |
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CMU Main Books 3rd Floor | G70.212 .L43 2001 |
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