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A review of U.S. participation in the International Organization for Standardization (ISO) and the International Electrotechnical Commission (IEC)

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Bibliographic Details
Main Author: DeVaux, Christine R.
Corporate Author: National Institute of Standards and Technology (U.S.)
Format: Microfilm Book
Language:English
Published: Gaithersburg, MD : [Springfield, Va. :] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [National Technical Information Service, distributor], [2000]
Series:NISTIR ; 6492.
Physical Description:
vii, 70 pages : illustrations ; 28 cm.
Subjects:
Holdings details from CMU Storage Gov Pub Microfiche C502
Copy 1 CMU Storage Gov Pub Microfiche C 13.58:6492 Available