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by National Semiconductor Metrology Program (U.S.)
Published: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1996
Description: volumes ; 28 cm.
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Description: volumes : illustrations.
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by National Semiconductor Metrology Program (U.S.)
Published: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995
Description: volumes ; 28 cm.
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