Search Results - Bertacco, Valeria

Valeria Bertacco

Valeria Bertacco is a professor of Electrical Engineering and Computer Science as well as Vice Provost for Engaged Learning at the University of Michigan. She previously served as the Associate Dean for Academic Programs and Initiatives at the University of Michigan Rackham Graduate School.

Bertacco headed the Center for Applications Driving Architectures (ADA) at the University of Michigan. Her work at the center includes leading initiatives to design processors that are especially tailored to run specific algorithms. In 2017, she was elected a fellow of the Institute of Electrical and Electronics Engineers for her contributions to Computer-aided Verification and Reliable System Design. Provided by Wikipedia
  • Showing 1 - 4 results of 4
Refine Results
  1. 1

    Scalable hardware verification with symbolic simulation by Bertacco, Valeria

    Published: Springer, 2006
    Description: 1 online resource (xx, 177 pages) : illustrations.
    SpringerLink - Click here for access
    eBook
  2. 2

    Post-silicon and runtime verification for modern processors by Wagner, Ilya

    Published: Springer, 2011
    Description: 1 online resource (xvii, 224 pages) : illustrations.
    Other Authors: “…Bertacco, Valeria…”
    SpringerLink - Click here for access
    eBook
  3. 3

    Hardware and software : verification and testing ; 9th International Haifa Verification Conference, HVC 2013, Haifa, Israel, November 5-7, 2013, Proceedings by International Haifa Verification Conference Haifa, Israel, SpringerLink (Online service)

    Published: Springer, 2013
    Description: 1 online resource (xix, 366 pages) : illustrations (some color).
    Other Authors: “…Bertacco, Valeria…”
    SpringerLink - Click here for access
    Conference Proceeding eBook
  4. 4

    Functional design errors in digital circuits : diagnosis, correction and repair by Chang, Kai-hui

    Published: Springer, 2009
    Description: 1 online resource (xxiv, 200 pages) : illustrations.
    Other Authors:
    SpringerLink - Click here for access
    eBook