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Format: Microfilm
Author: National Institute of Standards and Technology (U.S.)
Author: Ling, Alice V.
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2
Machine-tools Mathematical models
2
Turning (Lathe work) Mathematical models
1
Computer interfaces Standards
1
Coordinate transformations
1
Information display systems
1
Machine parts Inspection
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1
Machining Computer programs
1
Probes (Electronic instruments) Calibration
1
Scanning electron microscopes
1
Semiconductor wafers Measurement
1
Spline theory
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