TechnoStress coping with technology @work @home @play /

Main Author: Weil, Michelle M.
Other Authors: Rosen, Larry D.
Format: Book
Language: English
Published: New York : J. Wiley, [1997]
Physical Description: xiii, 240 pages ; 23 cm.
Subjects:

CMU Main Books 3rd Floor

LocationCall Number: Status
CMU Main Books 3rd Floor T14.5 .W38 1997 Available
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