An examination of the relationship between normalized residuals and item information

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Bibliographic Details
Main Author: Ackerman, Terry A.
Corporate Author: National Institute of Education (U.S.)
Format: Government Document Book
Language:English
Published: [Washington, D.C.?] : [National Institute of Education], [1986]
Physical Description:
28 pages, 1 unnumbered page : illustrations ; 28 cm.
Subjects:
Educational tests and measurements -- United States.
Online Access:https://eric.ed.gov/?id=ED272578
Description
Item Description:"Paper presented at the 1986 AERA annual meeting, San Francisco, CA, April 19, 1986."
Running title: Residual analysis.
Distributed to depository libraries in microfiche.
"Pub date Apr 86"--Doc. resume.
Physical Description:
28 pages, 1 unnumbered page : illustrations ; 28 cm.
Bibliography:Includes bibliographical references (page 18).

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