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Metrology for radio-frequency technology a bibliography of NIST publications /

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Bibliographic Details
Main Author: Lyons, Ruth Marie
Corporate Author: National Institute of Standards and Technology (U.S.)
Format: Government Document Microfilm Book
Language:English
Published: Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
Series:NISTIR ; 5097.
Physical Description:
iii, 153 pages ; 28 cm.
Subjects:

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