Scanning electron microscopy and x-ray microanalysis

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Bibliographic Details
Other Authors: Goldstein, Joseph, 1939-2015
Format: Book
Language:English
Published: New York : Springer, [2003]
Edition:3rd ed.
Physical Description:
xix, 690 pages : illustrations (some color) ; 26 cm + 1 CD-ROM (4 3/4 in.)
Subjects:
Scanning electron microscopy.
X-ray microanalysis.
Online Access:Table of contents
Holdings details from CMU Main Books 3rd Floor C502
Copy 1 CMU Main Books 3rd Floor QH212.S3 S29 2003 Available
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