Loading…
Scanning electron microscopy and x-ray microanalysis
Saved in:
Other Authors: | |
---|---|
Format: | Book |
Language: | English |
Published: |
New York :
Springer,
[2003]
|
Edition: | 3rd ed. |
Physical Description: |
xix, 690 pages : illustrations (some color) ; 26 cm + 1 CD-ROM (4 3/4 in.) |
Subjects: | |
Online Access: | Table of contents |
Copy 1 | CMU Main Books 3rd Floor | QH212.S3 S29 2003 |
Available
Request Chapter Scan |
---|