Cover Image

Structural, syntactic, and statistical pattern recognition joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : proceedings /

Corporate Authors: International Workshop on Structural and Syntactic Pattern Recognition Hong Kong, China)
Other Authors: International Workshop on Structural and Syntactic Pattern Recognition, Yeung, Dit-Yan, 1960-, International Association for Pattern Recognition., International Workshop on Statistical Techniques in Pattern Recognition
Format: eBook
Language: English
Published: Berlin ; New York : Springer, [2006]
Physical Description: 1 online resource (xxi, 939 pages) : illustrations.
Series: Lecture notes in computer science ; 4109.
Subjects: