Particle size characterization

Main Author: Jillavenkatesa, Ajit.
Other Authors: Dapkunas, S., Lum, Lin-Sien H., National Institute of Standards and Technology (U.S.)
Format: Microfilm
Language: English
Published: [Gaithersburg, Md.] : Washington, D.C. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., [2001]
Physical Description: v, 165 pages : illustrations ; 23 cm.
Also available from the NIST website. Address as of 3/9/2005: http://www.msel.nist.gov/practiceguides/SP9601.pdf; current access via PURL.
Series: NIST special publication ; no. 960-1.
NIST recommended practice guide.
Subjects:
Online Access: http://purl.access.gpo.gov/GPO/LPS58724
http://utils.louislibraries.org/cgi-bin/lz0050.x?sitecode=LAVW?http://purl.access.gpo.gov/GPO/LPS58724