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C 13.10:260-115
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Calibration of NIST standard reference material 3201 for 0.5 inch (12.65 mm) serial serpentine magnetic tape cartridge |
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C 13.10:260-116
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Glass filters as a standard reference material for spectrophotometry selection, preparation, certification, and use of SRM 930 and SRM 1930 |
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C 13.10:260-117
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Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems |
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C 13.10:260-118
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Standard reference materials. Calibration of NIST standard reference material for 3202 for 18-track, parallel, and 36-track, parallel serpentine, 12.65mm (0.5 in), 1491cpmm (37871 cpi), magnetic tape cartridge |
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C 13.10:260-119
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Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems standard reference materials |
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C 13.10:260-120
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A users' guide to NIST SRM 2084 CMM probe performance standard |
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C 13.10:260-121
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Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry |
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C 13.10:260-122
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Polystyrene films for calibrating the wavelength scale of infrared spectrophotometers - SRM 1921 |
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C 13.10:260-123
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Infrared transmittance standards : SRMs 2053, 2054, 2055, and 2056 |
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C 13.10:260-124
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Standard reference material 1744 : aluminum freezing-point standard |
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C 13.10:260-125
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Statistical aspects of the certification of chemical batch SRMs |
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C 13.10:260-126
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The NIST traceable reference material program for gas standards |
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C 13.10:260-128
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Transmission filters with measured optical density at 1064 nm wavelength SRMs 2046, 2047, 2048, 2049, 2050, and 2051 |
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C 13.10:260-129
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Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems |
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C 13.10:260-130
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Glass fiberboard, SRM 1450c, for thermal resistance from 280 K to 340 K |
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C 13.10:260-131
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The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements |
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C 13.10:260-132
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Indium freezing-point standard--SRM 1745 indium DSC melting-point standard--SRM 2232 |
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C 13.10:260-133/2001
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Acetylene ¹²C₂H₂ absorption reference for 1510 nm to 1540 nm wavelengt |
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C 13.10:260-135
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Film step tablet standards of diffuse visual transmission density SRM 1001 and SRM 1008 |
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C 13.10:260-136
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Definitions of terms and modes used at NIST for value-assignment of reference materials for chemical measurements |
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