Call Number (LC) Title Results
C 13.10:260-151 The NIST-traceable Referene-Material program for wavelength- reference absorption cells 1
C 13.10:260/2003 NIST standard reference materials catalog 1
C 13.10:270 (1965) Hydraulic research in the United States 1
C 13.10:305/ Publications of the National Bureau of Standards ... catalog
Publications of the National Institute of Standards and Technology ... catalog
2
C 13.10:305/SUPP. Publications of the National Institute of Standards and Technology ... catalog 1
C 13.10:330/2001 The international system of units (SI) 1
C 13.10:366/SUPP.4 Bibliography on atomic line shapes and shifts (July 1978 through March 1992) 1
C 13.10:400-79 Results of the Monte Carlo calculation of one- and two-dimensional distributions of particles and damage : ion implanted dopants in silicon 1
C 13.10:400-80 Silicon-on-insulator : a categorized bibliography, including abstracts 1
C 13.10:400-81 Automatic determination of the interstitial oxygen content of silicon wafers polished on both sides 1
C 13.10:400-82 Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption 1
C 13.10:400-83 A software program for aiding the analysis of ellipsometric measurements, simple models 1
C 13.10:400-84 A software program for aiding the analysis of ellipsometric measurements, simple spectroscopic models 1
C 13.10:400-85 EPROP, an interactive FORTRAN program for computing selected electronic properties of gallium arsenide and silicon 1
C 13.10:400-86 Thermal resistance measurements 1
C 13.10:400-87 A programmable reverse-bias safe operating area transistor tester 1
C 13.10:400-88 INSTANT-IGBT network simulation and transient ANalysis tool 1
C 13.10:400-89 Version 2.0 of the TXYZ thermal analysis program, TXYZ20 1
C 13.10:400-90 Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 1
C 13.10:400-92 Semiconductor measurement technology evolution of silicon materials characterization : lessons learned for improved manufacturing 1