Call Number (LC) | Title | Results |
---|---|---|
C 13.10:260-151 | The NIST-traceable Referene-Material program for wavelength- reference absorption cells | 1 |
C 13.10:260/2003 | NIST standard reference materials catalog | 1 |
C 13.10:270 (1965) | Hydraulic research in the United States | 1 |
C 13.10:305/ |
Publications of the National Bureau of Standards ... catalog Publications of the National Institute of Standards and Technology ... catalog |
2 |
C 13.10:305/SUPP. | Publications of the National Institute of Standards and Technology ... catalog | 1 |
C 13.10:330/2001 | The international system of units (SI) | 1 |
C 13.10:366/SUPP.4 | Bibliography on atomic line shapes and shifts (July 1978 through March 1992) | 1 |
C 13.10:400-79 | Results of the Monte Carlo calculation of one- and two-dimensional distributions of particles and damage : ion implanted dopants in silicon | 1 |
C 13.10:400-80 | Silicon-on-insulator : a categorized bibliography, including abstracts | 1 |
C 13.10:400-81 | Automatic determination of the interstitial oxygen content of silicon wafers polished on both sides | 1 |
C 13.10:400-82 | Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption | 1 |
C 13.10:400-83 | A software program for aiding the analysis of ellipsometric measurements, simple models | 1 |
C 13.10:400-84 | A software program for aiding the analysis of ellipsometric measurements, simple spectroscopic models | 1 |
C 13.10:400-85 | EPROP, an interactive FORTRAN program for computing selected electronic properties of gallium arsenide and silicon | 1 |
C 13.10:400-86 | Thermal resistance measurements | 1 |
C 13.10:400-87 | A programmable reverse-bias safe operating area transistor tester | 1 |
C 13.10:400-88 | INSTANT-IGBT network simulation and transient ANalysis tool | 1 |
C 13.10:400-89 | Version 2.0 of the TXYZ thermal analysis program, TXYZ20 | 1 |
C 13.10:400-90 | Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 | 1 |
C 13.10:400-92 | Semiconductor measurement technology evolution of silicon materials characterization : lessons learned for improved manufacturing | 1 |